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| Want this Instrument? | Model: | Philips XL40FEG |
| Contact Us Today | Type: | Scanning Electron Microscope |
| Year MFG: | 1996 | |
| Back to the instrument list | Warranty: | 30 Days |
| Installation: | Included | |
| Price: | $150,000 | |
| Comments: |
| Description | |||
|
Electron Beam: |
Schottky FEG, 30kV, 7nm@1kV | ||
|
Specimen Stage: |
5 axis, 4 motorized, Eucentric Tilt, xy:150mm x 150mm | ||
|
Detectors: |
Sec | ||
|
Analytical: |
EDX Ready | ||
| Computer/Software: | Windows NT, Philips MCNT | ||
|
Vacuum System: |
Diffusion w/mechanical RP | ||
| Other components: | EDAX/TSL Crystallography Orientation Imaging Microscopy (OIM) - Camera and analytical Software |