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| Want this Instrument? | Model: | JEOL 6400F |
| Contact Us Today | Type: | Scanning Electron Microscope |
| Year MFG: | 1992 | |
| Back to the instrument list | OEM Service Contract: | Off |
| Warranty: | Optional | |
| Installation: | Optional | |
| Price: | $125,000 | |
| Comments: | Will be refurbed: |
| Description | |||
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Electron Beam Data: |
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| Electron Source: | Cold Field Emission | ||
| Accelerating Voltage: | |||
| Resolution: | |||
| Magnification: | |||
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Specimen Stage: |
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| x,y: | |||
| z: | |||
| t: | |||
| r: | |||
| Access: | |||
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Detectors: |
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Analytical: |
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| MFG/Model: | |||
| Detector: | |||
| Software: | |||
| Computer/Software: | |||
| Computer: | |||
| Operating System: | |||
| Software: | |||
| Data Recording: | Visions Digital Image | ||
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Vacuum System: |
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| Gun: | |||
| Chamber: | |||
| Rough: | |||
| Other components: |