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| Want this Instrument? | Model: | FEI XL-30 ESEM |
| Contact Us Today | Type: | Scanning Electron Microscope |
| Year MFG: | 2001 | |
| Back to the instrument list | OEM Service Contract: | Off |
| Warranty: | Optional | |
| Installation: | Optional | |
| Price: | $150,000 | |
| Comments: | Refurbished |
| Description | |||
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Electron Beam Data: |
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| Electron Source: | Tungsten | ||
| Accelerating Voltage: | 30kV | ||
| Resolution: | 4nm hi & lo Vac | ||
| Magnification: | 6x to 200,000x | ||
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Specimen Stage: |
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| x,y: | 50mm x 50mm | ||
| z: | 25mm | ||
| t: | -15º to +75º | ||
| r: | 360º | ||
| Access: | Front Drawer | ||
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Detectors: |
Everhart Thornely (Hi-Vac), GSED-Gaseous Sec Electron (Lo-Vac) | ||
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Analytical: |
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| MFG/Model: | EDAX | ||
| Detector: | Light Element | ||
| Software: | |||
| Computer/Software: | |||
| Computer: | |||
| Operating System: | Windows NT | ||
| Software: | |||
| Data Recording: | |||
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Vacuum System: |
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| Gun: | |||
| Chamber: | Turbo | ||
| Rough: | Mechanical RP | ||
| Other components: |