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| Want this Instrument? | Model: | JEOL 840 I |
| Contact Us Today | Type: | Scanning Electron Microscope |
| Year MFG: | 1984 | |
| Back to the instrument list | OEM Service Contract: | 1984 to August 2003 |
| Warranty: | Optional | |
| Installation: | Optional | |
| Price: | $55,000 | |
| Comments: | De Installed May 2006 |
| Description | |||
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Electron Beam Data: |
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| Electron Source: | W, LaB6 | ||
| Accelerating Voltage: | 0 to 40kV | ||
| Resolution: | 4nm | ||
| Magnification: | 10x to 300,000x | ||
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Specimen Stage: |
Eucentric Tilt | ||
| x,y: | |||
| z: | |||
| t: | |||
| r: | |||
| Access: | |||
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Detectors: |
Sec | ||
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Analytical: |
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| MFG/Model: | JEOL FCS-40 Wavelength | ||
| Detector: | JEOL Four crystal WDS and Gresham EDS | ||
| Software: | WDS: Kevex Sesame control, EDS 4pi | ||
| Computer/Software: | |||
| Computer: | |||
| Operating System: | |||
| Software: | |||
| Data Recording: | |||
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Vacuum System: |
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| Gun: | Ion Getter | ||
| Chamber: | ODP | ||
| Rough: | Mechanical | ||
| Other components: |