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Want this Instrument? Model: JEOL 6360LV
Contact Us Today Type: Scanning Electron Microscope
Year MFG: 2000
Back to the instrument list Location Hsin Chu Taiwan
Warranty: 30 Days
Installation: Included
Price: $100.000
Comments: In Crates will be refurbished

Description Variable Pressure SEM

Electron Beam:

Tungsten Thermionic, 30kV

Specimen Stage:

5 axis, manual, Eucentric tilt, xy: 80mm x 40mm

Detectors:

Sec 3.0nm

Bse 4.0nm

Analytical:

EDX Ready
Computer/Software: Windows 2000

Vacuum System:

Diffusion w/mechanical RP
Other components: