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| Want this Instrument? | Model: | Hitachi S-5000 FEG |
| Contact Us Today | Type: | Scanning Electron Microscope |
| Year MFG: | 1998 | |
| Back to the instrument list | OEM Service Contract: | Off |
| Warranty: | Optional | |
| Installation: | Optional | |
| Price: | $175,000 | |
| Comments: |
| Description | |||
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Electron Beam Data: |
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| Electron Source: | Cold FEG | ||
| Accelerating Voltage: | 30kV | ||
| Resolution: | 0.6nm @ 30kV, 0.35nm @ 1kV | ||
| Magnification: | 250x to 800,000x | ||
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Specimen Stage: |
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| x,y: | 3.5mm x 2mm | ||
| z: | |||
| t: | ±40º | ||
| r: | |||
| Access: | Side entry | ||
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Detectors: |
Sec, Bse | ||
| Computer/Software: | PCI Digital Imaging | ||
| Operating System: | Windows | ||
| Software: | PCI ver 5.5 | ||
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Analytical: |
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| MFG/Model: | Noran Vantage | ||
| Detector: | Light Element, Ln² | ||
| Software: | Vantage ver. 1.5.1 | ||
| Data Recording: | Polaroid, digital output, | ||
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Vacuum System: |
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| Gun: | Ion | ||
| Chamber: | Diffusion | ||
| Rough: | Mechanical | ||
| Other components: |