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| Want this Instrument? | Model: | Hitachi S-5000 FEG |
| Contact Us Today | Type: | Scanning Electron Microscope |
| Year MFG: | 1998 | |
| Back to the instrument list | Location: | San Diego California |
| Warranty: | 30 Days | |
| Installation: | Included | |
| Price: | $100,000 | |
| Comments: | In use @ customer site. Demonstratable |
| Description | |||
|
Electron Beam Data: |
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| Electron Source: | Cold FEG | ||
| Accelerating Voltage: | 30kV | ||
| Resolution: | 0.6nm @ 30kV, 0.35nm @ 1kV | ||
| Magnification: | 250x to 800,000x | ||
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Specimen Stage: |
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| x,y, t: | 3.5mm x 2mm, ±40º | ||
| Access: | Side entry | ||
|
Detectors: |
Sec, Bse | ||
| Computer/Software: | |||
| Operating System: | Window s95 | ||
| Software: | PCI ver 5.5 | ||
|
Analytical: |
EDX Ready | ||
|
Vacuum System: |
Diffusion w/mechanical RP | ||
| Other components: |