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| Want this Instrument? | Model: | Hitachi S-4700 FEG |
| Contact Us Today | Type: | Scanning Electron Microscope |
| Year MFG: | 1997 | |
| Back to the instrument list | Location: | Dallas Texas |
| Warranty: | 30 Days | |
| Installation: | Included | |
| Price: | $250,000 | |
| Comments: | In use at customer site |
| Description |
|
Electron Beam: |
Cold Field Emission, 30kV, 2.1nm@1kV | ||
|
Specimen Stage: |
Type II: 5 axis, 5 motorized, Eucentric Tilt, xy:100mm x 50mm, 6" load lock | ||
|
Detectors: |
Sec | ||
|
Analytical: |
Oxford INCA, Light element detector, imaging and x-ray mapping | ||
| Computer/Software: | Windows 95, PCI 5.0 Network Card |
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|
Vacuum System: |
Turbo w/dry scroll RP | ||
| Other components: | ExB Filter: collects and separates SE, compositional SE and BSE electron signals |