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| Want this Instrument? | Model: | Hitachi S-4700 FEG #3 |
| Contact Us Today | Type: | Scanning Electron Microscope |
| Year MFG: | 1998 | |
| Back to the instrument list | OEM Service Contract: | Off |
| Warranty: | Optional | |
| Installation: | Optional | |
| Price: | $275,000 | |
| Comments: | Refurbished |
| Description | |||
|
Electron Beam Data: |
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| Electron Source: | Cold Field Emission | ||
| Accelerating Voltage: | 30Kv | ||
| Resolution: | 1.5nm @ 15kV and 2.1nm @ 1kV | ||
| Magnification: | 20x to ~ 500,000x | ||
|
Specimen Stage: |
Type I | ||
| x,y: | 25mm x 25mm | ||
| z: | 105 ~ 26mm | ||
| t: | -5º to +45º | ||
| r: | 360º | ||
| Access: | 100mm Load Lock | ||
|
Detectors: |
Sec | ||
| Computer/Software: | |||
| Computer: | PC | ||
| Operating System: | Windows 95 | ||
| Software: | |||
| Data Recording: | Digital Imaging | ||
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Vacuum System: |
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| Gun: | Ion | ||
| Chamber: | Turbo | ||
| Rough: | Mechanical | ||
| Other components: |