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| Want this Instrument? | Model: | FEI XL810 #2 |
| Contact Us Today | Type: | Scanning Electron Microscope |
| Year MFG: | 1998 | |
| Location: | Portland Oregon | |
| Back to the instrument list | Warranty: | 30 Days |
| Installation: | Included | |
| Price: | $250,000 | |
| Comments: | In crates will be refurbished |
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| Description | |||
|
Electron Beam: |
Schottky FEG, 30kV, 3nm @1kV | ||
|
Specimen Stage: |
200mm 5 axis motorized, computerized eucentric tilt stage 200mm Load Lock for wafers and pieces |
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Detectors: |
Sec, Bse | ||
|
Analytical: |
EDX Ready | ||
| Computer/Software: | Windows NT FEI MCNT |
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Vacuum System: |
Turbo w/mechanical RP | ||
| Other components: |