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Want this Instrument? Model: FEI FIB 800
Contact Us Today Type: Focused Ion Beam Microscope
Year MFG: 1997
  Location: Portland Oregon
Back to the instrument list Warranty: 30 Days
Installation: Included
Price: $195,000
Comments:  Refurbished, crated

Description

Ion Beam Data:

 Ga LMIS, 30kV

Specimen Stage:

200mm stage, 5 axis 5 motorized

200mm load lock

Detectors:

CDEM

Computer/Software:

NT OS

FEI XP FIB control

Data Recording: Digital Out via Network card
Gas: Up to 4 GIS

Vacuum System:

Turbo with RP

Other components:

 Optical Microscope