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| Want this Instrument? | Model: | FEI FIB 200 xp |
| Contact Us Today | Type: | Focused Ion Beam Microscope |
| Year MFG: | 1998 | |
| Back to the instrument list | Post Install Service: | Optional |
| Installation: | Optional | |
| Price: | Call | |
| Comments: |
| Description | |||
|
Ion Beam Data: |
Ga, 11nA, 7nm | ||
|
Specimen Stage: |
50mm x50mm | ||
|
Detectors: |
CDEM | ||
|
Computer/Software: |
Windows NT, FEI xp | ||
| Data Recording: | Video printer, Network card | ||
| Gas: | Up to 4 | ||
|
Vacuum System: |
Diffusion with Mechanical RP | ||
|
Other components: |