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Want this Instrument? Model: FEI FIB 611
Contact Us Today Type: Focused Ion Beam Microscope
Year MFG: 1992
Back to the instrument list Post Install Service: Optional
Installation: Optional
Price: $ 65,000
Comments:  Will be refurbed:

Description

Ion Beam Data:

 Ga Gun, 30kV,

Specimen Stage:

6" Eucentric computer and motor control

Detectors:

CDEM for sec and ion images

Computer/Software:

Windows 3.11
Data Recording: Video Printer, TIFF
Gas: Up to 4 Gas: metal etch, metal deposition, insulator etch, insulator etch

Vacuum System:

Turbo w/mech RP

Other components: