 |
Home | Our Services | Contact Us | Sold Instruments |
| Want this Instrument? | Model: | FEI FIB 200 Magnum |
| Contact Us Today | Type: | Focused Ion Beam Microscope |
| Year MFG: | 1997 | |
| Back to the instrument list | OEM Service Contract: | On |
| Post Install Service: | Optional | |
| Installation: | Optional | |
| Price: | $ 275,000 | |
| Comments: |
| Description | |||
|
Ion Beam Data: |
|||
| Ion Source: | |||
| Accelerating Voltage: | |||
| Resolution: | |||
| Magnification: | |||
|
Specimen Stage: |
|||
| x,y: | |||
| z: | |||
| t: | |||
| r: | |||
| Access: | |||
|
Detectors: |
|||
| Computer/Software: | |||
| Computer: | |||
| Operating System: | |||
| Software: | |||
| Data Recording: | |||
| Gas: | |||
| Metal Dep: | |||
| Insulator Dep | |||
| Etch 1: | |||
| Etch 2: | |||
|
Vacuum System: |
|||
| Column: | |||
| Chamber: | |||
| Rough: | |||
| Other components: |