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Want this Instrument? Model: FEI DualBeam 235
Contact Us Today Type: DualBeam (FIB/SEM) Microscope
Year MFG: 2002
  Location: Portland Oregon
Back to the instrument list Post Install Service: 30 Days
Installation: Included
Price: $600,000
Comments: Refurbished and demonstratable

Description
 

Electron Beam Data:

  3nm Schottky FEG

Ion Beam Data:

 Ga 7nm/22nA Magnum

Specimen Stage:

5 axis, Tilt eucentric, xy: 50mm x 50mm

Detectors:

SEC, CDEM

Computer/Software:

Windows NT
Data Recording: Video Printer or Network card
Gas: 2 GIS

Vacuum System:

Turbo, Mechanical RP

Other components:

Optical Microscope